Three-Dimensional Atom Localization and Microscopy in a Three-Level Λ-Type Atomic Configuration

Abstract

This paper introduces a method for achieving precise three-dimensional atomic microscopy within a three-level Λ-type configuration, utilizing a probe field and a standing-wave control field. The microscopy information is derived from the imaginary part of the effective susceptibility, which reveals the absorption spectrum. Applications of this approach to atomic microscopy are demonstrated for scenarios involving two atoms and interactions near boundary walls. The atomic positions are precisely controlled through parameters such as detunings (∆), field strengths (β₁, _p), decay rates (γ_{a, b}), and field phases (ϕ_1y, ϕ_1z). The theoretical findings presented in this study highlight the potential for significant advancements in applications such as laser cooling and nanolithography.